Epsilometer
solution for measuring the dielectric properties of materials measures
dielectric substrate materials at frequencies from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3 mm thick.
This solution uses a new methodology, according to Dr. John Schultz of Compass Technology,
Unlike previous dielectric analysis technologies, this new method uses
computational electromagnetic modeling to invert the dielectric
permittivity and loss. This represents a significant advance over
conventional methods, which use analytical approximations and are
limited to frequencies below 1 GHz.
The Epsilometer solution includes R60 VNA with software, measurement fixture, Epsilometer software, and calibration sample.
The Epsilometer
solution has been developed in collaboration with Compass Technology, a
leading provider of material measurement solutions and systems.
Specifications :
Frequency range: 3 MHz to 6 GHz
Impedance: 50 Ohm
Sheet thickness 0.3 to 3 mm
The database is populated up to a permittivity of 25
Suitable for testing ceramics (sample surface must be flat)
Datasheets
Epsilometer Information Sheet
Applications :
Epsilometer can be used in design and manufacturing of microwave circuit
materials, antenna radomes, antenna substrates, packaging for wireless
devices 4G/LTE, WiFi, Bluetooth, 5G, IoT, etc. and many other
applications.
Software/ Documentation :
50 Ohm VNAs to 44GHZ
SC Series VNAs to 9 GHz
